Leonardo: A Toolset to Remove Sample-Induced Aberrations in Light Sheet Microscopy Images
Authors Liu Y, Müller G, Kowitz L, Chobola T, Weiss K, Maier P, Luo J, Roeßing M, Stenzel M, Grüneboom A, Paetzold J, Ertürk A, Navab N, Marr C, Chen J, Huisken J, Peng T Journal Research Square Citation Research Square 2025. Abstract Selective plane illumination microscopy (SPIM, also known